Agilent Technologies 8960 Series 10
Wireless Communications Test Set
Product Note
Increase Your Throughput with
Reduced Instruction Parallel Processing
Ensuring that mobile stations
meet specifications versus
minimizing the time it takes to
perform the required measurements creates two conflicting
strategies for the final-test phase
of production. Thoroughly testing
a mobile requires making many
measurements, yet increasing
throughput means reducing test
time. Agilent Technologies
resolves this conflict with the
Agilent Technologies 8960
Series 10 wireless communications test set. Designed to maximize measurement speed, the
Pre-Test
8960 Series 10 is effective anywhere that high-speed transmitter
measurements are advantageous.
Its ability to run transmitter tests
concurrently with BER tests
makes final test a perfect place to
use the 8960 Series 10.
mobile station manufacturing test
sets, the 8960 Series 10 can save
50% or more of the time in the
final-test stage of GSM testing.
The 8960 Series 10 is based on
Agilent Technologies’ proprietary
reduced instruction parallel
processing (RIPP) architecture.
You get the proven benefits of
Agilent’s accuracy and repeatability, along with a test platform that
maximizes measurement speed.
As compared to previous GSM
www.agilent.com/find/8960support
to find more information on how the
8960 Series 10 can help you be more
successful and competitive in
manufacturing GSM mobile phones.
This product note provides a look at
the speed advantage of the 8960
Series 10. Use the Agilent website at
Contents
Reduced Instruction Parallel Processing
Architecture ....................................................... 2
Test Sequence Examples .................................. 3
Transmitter Power ............................................. 4
Phase/Frequency Error ..................................... 5
Power Versus Time ........................................... 6
Output RF Spectrum .......................................... 7
Comparing Transmitter Measurements .......... 8
Conclusion .......................................................... 8
Final Tests
Phone Assembly
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Visual Test
Keyboard Test
Radio Tests
8960A
W IRE
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R F COM
C O M M UNICAT
U N I C ATIONS
I O N S TE
TEST SET
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MEASUREMENT
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REGISTERS
UTILITIES
SAVE
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LOCAL
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CONFIG
CONTINUOUS
ALL
DELETE
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MEASUREMENT
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INSTRUMENT
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SELECTION
REGISTER
RECALL
MAX PWR 10 W
CONTINUOUS
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Transmitter Tests:
• TX Power
• Phase/Frequency Error
• Output RF Spectrum
• Power vs Time
D
Reduced Instruction Parallel Processing Architecture
RIPP is Agilent Technologies’ proprietary architecture
that addresses everything from overall system architecture to specific measurement architecture. A key
result from RIPP is that the manual user interface and
the remote user interface are independent of each
other, increasing operation speed and simplifying
programming. Overall, RIPP provides improved
individual measurement speed, optimal test sequence
speed, and allows for concurrent receiver and transmitter tests.
8960 Series 10 can handle multiple processes at the
same time. With optimized algorithms and tasks
optimally distributed among the processors, full
advantage is taken of the high-speed internal communication available on the VME bus. Complementing
parallel processing are dual-receiver paths and multiple samplers.
Dual-Receiver Paths - With two independent receiver
paths, call processing is completely separate from
making measurements. The digital signal processing
(DSP) processor makes measurements while the
protocol processor maintains the link. Any non-ADC
hardware control is handled concurrently by the host
processor and master serial control chips, providing
high-speed parallel communication.
Reduced Instruction specifically refers to the most
compact and easy-to-use remote user interface in the
industry. The commands and their structure are easy
to learn, and the resulting code is more than 25% less
than for other test sets. Statistical results, measurement timeouts, and data integrity are features provided with standard commands. Commands are available
to fully synchronize the 8960 Series 10 with the mobile
phone and an external controller. No extra code
development or maintenance is required for fullfeatured production tests.
Multiple Samplers - Multiple analog to digital converters (samplers) provide multiple signal access to the
DSP processor. The DSP processor controlling the
samplers over a high-speed PCI bus provides the 8960
Series 10 with the ability to optimize a sequence of
measurements. Look at “Comparing Transmitter
Measurements” in this document to understand the
measurement speed of the 8960 Series 10.
Parallel Processing means hardware designed to
accommodate fast microprocessors running in parallel. Using a true multi-tasking operating system, the
Agilent Technologies 8960 Functional Block Diagram
Host
Processor
User
Interface
High-Speed
Communication
High-Speed
VME Bus
Demodulation Path
Power Detector Path
Multiple
Samplers
High-Speed
PCI Bus
DSP
Processor
IF Measurement Path
Signal
Generator
Protocol
Processor
Output
RIPP architecture provides measurement speed which
is typically 10 to 30 times faster than currently available test sets. This speed significantly increases the
throughput on your production lines.
2
Test Sequence Examples
The graph in figure 1 is a performance comparison of
the Agilent Technologies 8960 Series 10 and Agilent
Technologies 8922 test sets. Two test sequences were
used to demonstrate the complete speed advantage
that is provided by RIPP architecture for final test.
included with the TX power measurement at 3
power levels on 2 channels and a 20 burst phase/
frequency error measurement at 1 power level
per channel.
These test sequences are just two examples of the
extraordinary speed of the 8960 Series 10. Use the data
from “Comparing Transmitter Measurements” in this
document to calculate the 8960 Series 10 speed on
your test sequence.
• Test Sequence 1 is representative of what might
be used today in final test; transmitter power (TX
power) and power-versus-time measurements at 3
power levels on 2 channels, and phase/frequency
error measurements at 1 power level per channel.
Although there can be an advantage in measuring
multiple bursts of the waveform measurements
(power vs time and phase/frequency error), the
time penalty incurred with current generation test
sets usually prohibits multiple measurements. In
this test sequence, 5 bursts are measured on both
power versus time and phase/frequency error to
demonstrate the viability of the 8960 Series 10 for
high-speed multi-burst measurements.
630 s
Transmitter Tests Total-Time
(in seconds)
600
• Test Sequence 2 is not typical of what is used in
final test today, but was chosen to demonstrate the
flexibility the 8960 Series 10 has in meeting potentially challenging test scenarios. Measuring output
RF spectrum or making high burst count measurements results in a high cost of test time when using
the current generation of test sets. In this test
sequence a 50 burst output RF spectrum measurement at 2 offsets, both modulation and switching, is
Test Seq. 1
Test Seq. 2
40
30 s
30
20
10
3.5 s
7.5 s
0
8960
8922
Test Set
Figure 1
Test Sequence 1 (for the Agilent Technologies 8960 Series 10)
Call Processing
Time
(varies with
mobile phone)
+
Phase/Frequency
Error
5 bursts
0.130 s x 2
+
TX Power
1 burst
0.012 s x 6
+
Power vs Time
5 bursts
0.200 s x 6
Total Test Time
3.5 s
Test Sequence 2 (for the Agilent Technologies 8960 Series 10)
Call Processing
Time
(varies with
mobile phone)
+
Phase/Frequency
Error
20 bursts
0.480 s x 2
+
TX Power
1 burst
0.012 s x 6
The 8960 Series 10 reduces multi-channel,
multi-power, and multi-burst test sequences by a
factor of 5 to 20. Full-featured test times under
5 seconds are achievable.
3
+
Output RF
Spectrum
50 bursts
0.740 s x 6
Total Test Time
7.5 s
Transmitter Power
Transmitter power is the most frequently made measurement in the GSM mobile station manufacturing
process. It is critical that mobile phones operate to
GSM standards. To meet these standards and to
conserve battery life, transmitter power levels on the
mobile are typically adjusted and set in an extensive
calibration test mode process (non-call processing);
and power levels are then measured again in an active
cell test sequence (call processing). All this means
that many transmitter power measurements are
performed during GSM mobile manufacturing.
ments timed at the GSM frame rate.
Figure 2 shows the timing of a measurement, compared
with the GSM bursts, to demonstrate that the 8960 Series
10 actually is faster than the GSM frame rate.
The transmitter power measurement starts with a
proprietary power detector circuit that has greater
than 50 dB dynamic range, less than 5 µs full response
time, 3 GHz wide-band coverage and independent
calibration. The measurement completes in the DSP
processor with an optimized algorithm and real-time
control of calibration. What this means is the 8960
Series 10 provides high-speed GSM transmitter power
measurements with no user calibration required. The
only overhead with measurements is call processing or
mobile station control. There is never any powercalibration overhead.
High-speed, accurate transmitter power measurements
not only provide a tremendous benefit in reducing
manufacturing test time, but they also allow for fast
detection of phone instability. The 8960 Series 10
provides fast transmitter power measurements with
single bursts timed at 12 ms and multi-burst measure-
Transmitter Power Measurement Timing
(Agilent Technologies 8960)
Sample
Burst
0.5 ms
Sample
Burst
0.5 ms
Initiate
Measurement
(setup included)
4 ms
Compute
Wait
Measurement 1.6 ms
2.5 ms
n-Sample
Burst
0.5 ms
Compute
Measurement
2.5 ms
Wait
1.6 ms
Return
Results
4 ms
Frame 4.6 ms
Frame 4.6 ms
n-Frames
Transmitter Power Measurement Speed
(multi-burst)
35 ms
Agilent 8922
Agilent 8960
4.6 ms
0
Figure 2
5
10
15
20
Milliseconds (ms)
4
25
30
Phase/Frequency Error
The phase/frequency error measurement quantifies the
transmitter’s modulation performance of the mobile
phone, and provides a means of measuring the
frequency accuracy. GSM modulation precludes the
use of a traditional frequency counter. Although this
measurement is done less often than the transmitter
power measurement, due to the variability inherent in
the mobile station, it is generally desired as a multiburst measurement.
bursts timed at 40 ms and multi-burst measurements
timed at 23 ms/burst. The phase/frequency error
measurement is based on a proprietary algorithm
that depends on a high-speed ADC to capture the
waveform and a high-speed DSP processor for
measurement computation.
Figure 3 shows the timing of a measurement, to demonstrate the paralleling of burst sampling and measurement computation within RIPP architecture to optimize
test speed in the 8960 Series 10.
So although high-speed, accurate phase/frequency
error measurements will also reduce manufacturing
test time, they also allow for a better measurement in
the same or reduced time. The 8960 Series 10 provides
fast phase/frequency error measurement in with single
Phase/Frequency Error Measurement Timing
(Agilent Technologies 8960)
Initiate
Measurement
4 ms
Sample
Burst
0.5 ms
Sample
Burst
0.5 ms
Return
Results
4 ms
n-Sample
Burst
0.5 ms
Setup
Hardware
10 ms
Compute
Measurement
21.5 ms
n-Compute
Measurement
21.5 ms
Phase/Frequency Error Measurement Speed
(multi-burst)
500 ms
Agilent 8922
Agilent 8960
23 ms
0
100
200
300
400
Milliseconds (ms)
Figure 3
5
500
Power Versus Time
time measurement in the industry with single bursts
timed at 53 ms and multi-burst measurements at
37 ms/burst. The timing graphic in figure 4 demonstrates the paralleling of burst sampling and measurement computation within RIPP architecture.
The power versus time measurement verifies that the
mobile’s burst shape meets the mask as defined by the
GSM standards. This is a critical measurement because of the timing requirements in the GSM system.
Power versus time measurements can be done almost
as often as transmitter power measurements and even a
short multi-burst measurement is generally more
desirable than a single burst measurement.
The power versus time measurement uses the wide
dynamic range of the power detector circuit and the
high-speed sampling of the IF. The result is a fast
measurement which returns a pass/fail result
that is based on the entire burst, not just the userspecified offsets.
High-speed, accurate power versus time measurements will definitely reduce test times, as well as
provide more confidence in the phone’s performance.
The 8960 Series 10 provides the fastest power versus
Power Versus Time Timing
(Agilent Technologies 8960)
Initiate
Measurement
4 ms
Sample
Burst
0.5 ms
Sample
Burst
0.5 ms
Setup
Hardware
10 ms
Compute
Measurement
34.5 ms
n-Sample
Burst
0.5 ms
n-Compute
Measurement
34.5 ms
Power Versus Time Speed
(multi-burst)
500
Agilent 8922
37
Agilent 8960
0
100
200
300
Milliseconds
Figure 4
6
400
500
Return
Results
4 ms
Output RF Spectrum
The output RF spectrum (ORFS) measurement measures the out-of-channel emissions of a phone. These
emissions can be caused by either modulation or
switching. Both of these must be kept to low levels to
prevent interference to adjacent channels. Because of
the desire of GSM system providers to provide optimum performance in their networks, there is increasing pressure on GSM manufacturers for ORFS
measurement data.
ORFS measurement. The ORFS measurement
probably best represents how RIPP addresses specific
measurement architecture. Due to the proprietary
nature of this measurement that information can not be
shared, but what can be seen is the ease-of-use and the
speed of this measurement. As with all measurements
in the 8960 Series 10, a few easy steps manually or a
few high-level commands remotely, result in fast and
accurate results.
The 8960 Series 10 allows GSM manufacturers to
include a high-speed, accurate, ORFS measurement in
the mobile station manufacturing process. The initial
burst of an ORFS measurement with both modulation
and switching at two offsets is timed at 130 ms, with
subsequent bursts timed at 13 ms/burst.
The ORFS measurement uses the wide dynamic range
of the power detector circuit and the high-speed
sampling of the IF. It also uses an optimized DSP
processing algorithm to provide measurement results
that are twice as fast as any test set on the market
today. The proprietary Agilent Technologies
approach actually provides for 2 modulation
measurements per burst.
Figure 5 shows the timing of a single-burst, two offset
Output RF Spectrum Timing
(Agilent Technologies 8960; 2 offsets, switching and modulation)
Initiate
Measurement
4 ms
Return
Results
4 ms
Sample
Burst
0.5 ms
Tune IF
10 ms
Agilent Technologies
Proprietary Process
Cross
Calibration
76 ms
Output RF Spectrum Speed
(multi-burst, 2 offsets, switching and modulation)
2
Agilent 8922
.013 (13 ms)
Agilent 8960
0.0
Figure 5
0.5
1.0
1.5
2.0
2.5
Seconds
7
3.0
3.5
4.0
Comparing Transmitter Measurements
MEASUREMENT
NUMB ER OF
B URSTS
8922
TI M E
8960
TI M E
Tr a n s m i tte r Powe r
1
0.35 s
0.012 s
5
0.175 s
0.03 s
20
0.7 s
0.1 s
1
0.6 s
0.04 s
5
2.6 s
0.13 s
20
10 s
0.48 s
1
4s
0.13 s
5
12 s
0.18 s
50
100 s
0.74 s
1
0.8 s
0.053 s
5
2.8 s
0.2 s
20
10.3 s
0.74 s
P h a s e /F r e q u e n cy E r r o r
O u tp u t RF S p e ctr u m
(400 kHz and 600 kHz
offsets, modulation and
switching)
Powe r v s Ti m e
Conclusion
The Agilent Technologies 8960 Series 10 test set provides
ease of use and measurement speed along with accuracy and
repeatability. The result is high measurement throughput that does
not sacrifice the integrity of the measurement process. Test costs
are reduced, a high volume of phones that meet specifications are
passed, and failed phones are quickly and accurately identified.
With the 8960 Series 10 test set, you receive high throughput along
with high confidence in the measurement results.
For more information about the 8960 Series 10
Wireless Communications Test Set visit our web site at:
http://www.agilent.com/find/8960support
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ã Copyright Agilent Technologies 1999
All Rights Reserved
Technical data subject to change
Printed in U.S.A. 12/99
5968-7875E