a
0.15 M NaCl
b
1 M NaCl
Fig. S1: Fresnel-normalized X-ray reflection curves obtained from 6.5 bilayer samples
prepared at temperatures indicated and at constant ionic strength, either (a) I = 0.15 M NaCl
or (b) I = 1 M NaCl. For clarity the curves are shifted vertically relatively to each other. The
original data is given by the symbols and the fit to a 1-slab model by the solid lines.
a
3 M NaCl
b
4 M NaCl
Fig. S2: Fresnel-normalized X-ray reflection curves obtained from 6.5 bilayer samples
prepared at different temperatures as indicated and at constant ionic strength, either (a) I = 3
M NaCl or (b) I = 4 M NaCl, respectively. For clarity the curves are shifted vertically
relatively to each other. The original data is given by the symbols and the fit to a 1-slab model
by the solid lines.
Fig. S3: Representative histogram of the average distance of the polyelectrolyte complexes to
their six next neighbours (preparation conditions: I = 0.15 M NaCl, T = 15 °C). A fit to a
Gaussian distribution (red line) allows the determination of the average distance, which gives
the maximum in the histogram. This (most probable) average distance is taken to be the
length scale of the fine structure.
I = 0.15 M NaCl
T = 5°C
T = 15°C
T = 25°C
T = 35°C
T = 45°C
T = 55°C
Fig. S4: Surface morphology of 6.5 bilayer PEM prepared at constant I = 0.15 M NaCl and at
deposition temperatures as indicated. Each image width represents 5 µm.
I = 1 M NaCl
T = 15°C
T = 35°C
T = 25°C
T = 45°C
T = 55°C
Fig. S5: Surface morphology of 6.5 bilayer PEM prepared at constant I = 1 M NaCl and at
deposition temperatures as indicated. Each image width represents 5 µm.
I = 3 M NaCl
T = 5°C
T = 35°C
T = 25°C
T = 45°C
Fig. S6: Surface morphology of 6.5 bilayer PEM prepared at constant I = 3 M NaCl and at
deposition temperatures as indicated. Each image width represents 5 µm.