Product Bulletin - EDS
Element Silicon Drift Detector Series
• Compact design, easily
integrated into an
industrial environment
• Optimized for low
energy X-ray
transmission to increase
efficiency of light
element detection
The Element Silicon Drift Detector (SDD) Series delivers powerful
analytical capability in a compact package, maximizing
performance and flexibility, while providing streamlined operation for
fast results and ease of use.
• Spectrum, Quant, Point, Linescan, Mapping available
• Application specific,
easy to use software with
touchscreen capability
• Advanced low-noise electronics for outstanding throughputs
• Silicon nitride window for improved performance of light
elements and low energy detection
• Fast, efficient results for
industrial needs
• Focused on a wide
range of industries
edax.com
Element Silicon Drift Detector Series
Product Bulletin - EDS
Specifications
Outstanding light element performance
CK
Be K
Element SDD Series
CK
• Silicon Nitride (Si3N4)
window
OK
Be K line is shown at a beam voltage of
10 kV
• 30 mm2 chip
OK
NK
Acetaminophen sample showing light
elements (C, N and O) resolved even at
0.7 keV acceleration voltage.
Optimized for specific industry requirements
• 129 eV resolution
• Hermetically sealed
vacuum encapsulated
module
• X-ray Input > 1M cps
• Throughput > 300,000 cps
• Peak/Background
> 10,000/1
• Stable resolution
Focused software options
• Detection range: Be to Am
Feature
Analysis
• Thermoelectric (Peltier)
cooling (fan and LN
free)
Smart Quant
Element Mapping
Linescan Acquisition
Data Management & Reporting
Touchscreen
Element SDD






Spectra Survey
Optional
Live Net Mapping
Optional
Smart Phase Mapping
Optional
Smart Drift Correction
Optional
Offline Software License
Optional
© EDAX Inc., 2016 September
For more
more information
For
information about
about our
our products,
products, contact
contact
[email protected]
visit
edax.com.
[email protected] ororvisit
usus
atat
edax.com.