Inspire
Infrared Nanocharacterization System
Highest Resolution Nanoscale Chemical, Electrical,
and Mechanical Imaging
Innovation with Integrity
Atomic Force Microscopy
Discover New Structural Detail with
Highest Resolution Chemical Imaging
Bruker’s Inspire™ is a nanoscale
characterization system that
extends atomic force microscopy
(AFM) into the chemical regime
by providing infrared absorption
and reflection imaging based on
scattering scanning near-field optical
microscopy — the most powerful technique for
identifying composition at the nanoscale. For the first time, Inspire
makes 10-nanometer spatial resolution infrared chemical mapping widely available
in an easy-to-use, laser-safe package. Inspire instantly correlates nanochemical
information with molecular scale electrical and mechanical measurements that are
only possible with PeakForce Tapping®.
Simply put, Inspire redefines what’s possible with atomic force microscopy.
„„
Resolve unseen nanochemical detail on
an atomic resolution platform
„„
Expand your research with the widest
range of unique modes
„„
Experience the quickest, easiest, and safest
IR nanocharacterization
Image of IR absorption (1750 cm-1)
overlaid on height showing chemical
separation in thin PS/PMMA film on Si.
Image size 10 μm.
PeakForce Tapping—The Most Significant
Advance in Nanocharacterization
Bruker’s exclusive PeakForce Tapping permits the use
of greatly reduced imaging forces, leading to the most
consistent, highest resolution AFM imaging, from the softest
biological samples to very hard materials. PeakForce IR™ is a
revolutionary new technique that combines scattering SNOM
(sSNOM) signal acquisition with PeakForce Tapping feedback,
providing the full combined set of information and extending
chemical and plasmon imaging to new sample types, such as
suspended membranes.
Height
PeakForce IR delivers:
„„Nanoscale chemical and plasmon imaging even on sample
types not conducive to TappingMode™
Modulus
„„Instantly correlated PeakForce QNM® quantitative
nanomechanical modulus and adhesion mapping.
PeakForce QNM provides:
„„Highest resolution, fastest, most quantitative
nanomechanical mapping
Chemistry
„„Widest operating range for samples, from extremely soft
materials (~1 kPa) to hard metals (100 GPa)
PeakForce KPFM™ and PeakForce TUNA™ enable:
„„Quantitative work function maps with millivolt sensitivity at the
10-nanometer resolution level
PeakForce IR images providing
instantly correlated chemical and
nanomechanical information of a
Polystyrene/LDPE blend. Image size
1 μm x 2 μm.
„„Conductivity maps even on soft and fragile samples not amenable
to contact mode
ScanAsyst® ensures:
„„Automatic image optimization for consistent, expert-quality
results for all AFM users
„„More routinely high-resolution imaging than any other
AFM mode
“Inspire is really the first fully integrated sSNOM solution. That
combined with its PeakForce Tapping capabilities will allow us to
perform novel experiments right from the start. I am pleased to
partner with Bruker to expand the great potential of sSNOM as a
versatile tool for broader scientific discovery.”
– Gilbert C. Walker, Professor of Chemistry, University of Toronto.
Polymer brush imaged
with ScanAsyst. Image
size 2 μm.
Sample courtesy of S. Sheiko,
University of North Carolina,
Chapel Hill.
Highest Resolution Nanochemical
Imaging on all Materials
Most Powerful Chemical Mapping Approach
In addition to nanoscale absorption and reflection
imaging, Inspire also provides monolayer sensitivity
and 10-nanometer lateral resolution, routinely, by
employing sSNOM. Inspire succeeds where conventional
photothermal approaches fail due to lack of sensitivity
and low resolution caused by contact mode imaging.
Inspire achieves the highest spatial resolution
consistently, from resolving sub-30-nanometer phase
separations in block copolymers to detecting monolayers
in layered and 2D materials, such as pentacene, boron
nitride, and graphene, to interrogating inorganic crystals
and many other materials.
Highest Resolution by Design
With sSNOM, as with most AFM modes, a small tip
radius is critical to achieving high spatial resolution. A
single uncontrolled tip-sample collision caused by system
vibration or poor feedback will blunt or contaminate a
sharp tip. By building on an atomic-resolution platform
with an extremely small and stiff mechanical loop and
high response bandwidth, Inspire achieves a lower noise
floor than most AFMs, ensuring highest resolution every
time and for hours of imaging.
IR absorption (top,
1725 cm-1), and height
(bottom) of PS-b-PMMA block
copolymer, showing sub-30 nm
chemical separation. Image size
500 nm.
Taking Chemical Mapping to the Next Level
For the first time, Inspire enables chemical imaging to
be performed using PeakForce Tapping feedback. Where
conventional sSNOM imaging is subject to limitations
from stiction on steep side walls, air damping in
challenging geometries, vibration of thin membranes, and
spatial averaging when dipping into very soft samples,
PeakForce Tapping enables Inspire to perform the highest
resolution chemical imaging on all samples.
Atomic resolution
height image of graphite.
The Fourier transform
(insert) shows the
expected, undistorted
hexagonal symmetry.
Resolving 10 nm features
in IR reflection at 1933 cm-1
on Si/SiO2
IR reflection
(1900 cm-1) overlaid
on height, showing
monolayer sensitivity
on pentacene.
Image size 3.3 μm.
Widest Range of Nanocharacterization
and Unique Imaging Modes
Inspire goes beyond being an integrated
solution for nanoscale chemical and optical
imaging. It builds on the extensive set
of AFM modes and takes full advantage
of PeakForce Tapping technology. For
example, images of plasmons on
graphene and related effects on other
2D materials are easily generated on
Inspire. But what are the electronic
properties of grain boundaries that
reflect plasmon waves? With PeakForce
KPFM, Inspire can accurately, quickly, and
easily answer this question. PeakForce
KPFM successfully maps workfunction
with repeatability at the 10mV level and
with spatial resolution not attainable in
conventional AM-KPFM.
Graphene plasmonics. Image size 18 μm.
A
B
C
Height (A), adhesion (B), and
surface potential (C) images of
Sn-Pb obtained with PeakForce
KPFM. The workfunction
difference is accurately
mapped while nanoscale phase
structure in the adhesion map is
simultaneously revealed. Image
size 4 μm.
Inspire also can easily generate a nanochemical map of a polymer blend. When a blend constitutes the bulk
heterojunction of an organic photovoltaic device, the relationship of nanoscale chemistry to conductivity pathways
becomes interesting. Inspire offers PeakForce TUNA to answer this question. PeakForce TUNA has been shown
to resolve the lamellar ordering in current maps of thin films of P3HT, achieving a resolution not attainable with
conventional, contact mode based approaches.
PeakForce TUNA (A)
topography, (B) current, and
(C) adhesion maps reveal the
influence of an embedded
nanotube on P3HT lamellar
ordering and current
pathways. Image size 500
nm. Image courtesy of Philippe
Leclère et al, University of Mons
(UMONS) Belgium.
A
B
C
Quickest, Easiest, and Safest IR
Nanocharacterization
Inspire is the first laser-safe
sSNOM system, and the first
one that does not require
expertise in aligning free-space
laser optics. The infrared laser
radiation is completely contained,
eliminating any chance of exposure.
IR EasyAlign™ reduces alignment to
pointing and clicking on a new probe
position. The interferometer remains
aligned, independent of the laser
source and probe. An intuitive user
interface with complete integration
of laser and detector control ensures
a fast, successful setup every time
and even automates the acquisition of
hyperspectral image stacks. Inspire frees
you to focus on your next discovery.
Three Steps to Measurement Success
„„Select wavelength
„„Find hotspot with IR EasyAlign
„„Auto set phase
Automated Hyperspectral Imaging
Image stack (top) and associated absorption (red) and
reflection (black) spectrum, identifying the hourglass
shaped domain as PMMA.
Easily Customize Your System with
Accessories and Options
Inspire is a highly expandable platform
that can grow with your research needs.
You can access additional chemistries
by adding more tunable lasers at any
time. Adding lasers does not require
realignment, and switching between
lasers takes only minutes.
Bruker makes it easy to further expand
Inspire’s AFM capabilities with the
widest available selection of AFM
accessories and options. Add optional
accessories to image in liquid, under
electrochemical control, or under
temperature control. Or, add optional
application modules to perform
additional electrical measurements:
„„Conductive AFM (CAFM)
„„Tunneling AFM (TUNA)
Fluid cell: Probe holder
for operation in fluid.
„„PeakForce TUNA
„„Scanning spreading resistance microscopy (SSRM)
„„Scanning capacitance microscopy (SCM)
„„PeakForce KPFM
Inspire also performs nanoscale mechanical and thermal
characterization with force volume imaging and optional
PeakForce QNM, nanoscale thermal analysis, scanning
thermal microscopy, and nanoindentation.
Triangle DNA
origami imaged in
fluid. Image size
300nm. Sample
courtesy of Prof. M.
Endo and Prof. H.
Sugiyama, Kyoto
University.
Inspire delivers the most complete approach
to nanochemical research, enabling
a vast array of new correlated
PeakForce TUNA
applications module.
measurements, such as combined
chemical, conductivity, and
workfunction mapping down to
the molecular scale. Wherever
your research leads you, Inspire’s
performance and flexibility will help
you expand the frontier of knowledge.
PFTUNA image of vertical nanotubes: Shown are
height (left) and current (right), which are impossible
to image in contact mode.
Specifications
AFM Head
Application module-ready AFM head (supports all optional modes)
Scanners
125 μm x 125 μm X-Y x 5 μm Z range;
Other scanner options available upon request
Controller
NanoScope® V Control Station
Computer
Intel i-series , 16GB RAM, 1TB HD, DVD-RW drive, single 30 in. LCD display,
Windows 7 Operating System
Software
v9.x NanoScope real-time control software;
NanoScope v1.5 or later analysis software
Height Noise
IR Spatial Resolution
30 pm
10 nm typical, tip-radius limited
Modes
IR
General Imaging
„„ TappingMode IR
sSNOM
„„ PeakForce IR
„„ PeakForce IR-TUNA
and IR-KPFM
Available Material Characterization
„„ ScanAsyst
„„ PeakForce QNM
„„ Coductive AFM
„„ PeakForce Tapping
„„ PeakForce KPFM
„„ Tunneling AFM
„„ TappingMode
„„ PeakForce Capture
„„ Scanning Sprading
„„ Contact Mode Torsional
„„ Force Spectroscopy
Resonance Mode
„„ Scanning Tunneling
Microscopy
„„ Lateral Force Microscopy
„„ PhaseImaging
„„ Force Volume
„„ Nanoindentation
„„ Electric and Magnetic Force
Microscopy
Resistance microscopy
„„ Nanoscale Thermal Analysis
„„ Scanning Thermal Microscopy
„„ Liquid Imaging
„„ Electrochemical SPM
Bruker Nano Surfaces Division is continually improving its products and reserves the right to change
specifications without notice. © 2015 Bruker Corporation. All rights reserved. B081, Rev. C0
IR Optics
Integrated and laser-safe scattering SNOM system:
Includes all required optics, laser, and detector;
High-quality, broadband mid-IR optical components;
Lowest noise, liquid N2 -cooled detector;
Accurate interferometer control;
Tunable quantum cascade laser source with low relative intensity noise;
Optimized near-field excitation and collection optics with IR EasyAlign;
Additional laser sources can be added
Cover application images
Bruker Nano Surfaces Division
Santa Barbara, CA • USA
Phone +1.805.967.1400/800.873.9750
[email protected]
www.bruker.com/inspire
Lower left: IR absorption (1730 cm-1) showing chemical separation in
PS-PMMA blend (image size 5 μm).
Middle: IR absorption (1725 cm-1) of PS-b-PMMA block copolymer
(image size 500 nm).
Top-right: IR reflection (1097cm-1) of amelogenin protein fibrils
(Image size 1μm). Sample courtesy of S. Habelitz, University of CA, San Francisco.
Background: IR absorption (870 cm-1) showing graphene plasmonics
(image size 2x7 μm).