Testers for
Power Semiconductors
 Designed for production, quality assurance
and R&D: parameter (characteristics) and
high power tests
 High precision measurement with 16 bit resolution.
 Additional special tests as stability of values
(e.g. delta IR), ZTH with approximation function, …)
 High performance µP system with TI
TMS320C6701 high end floating point DSP
 Digital signal processing for superior
accuracy
 High speed:
very fast analog source regulation
continuous measuring with 100 kS/sec
low measuring program execution overhead
 4wire measurement for power contacts; contact (kelvin) check
 User programmable
 multiplexers permit testing of complex parts
(converter with additional components as
shunts, temperature sensors, …)
 Windows-like graphical user’s interface on a
standard PC
 Control system interfaces and PLC functions
General Supplier
Customer specific test
systems
As general supplier, we can provide whole automatic test systems with complex handlers as
feeding, straightening, contacting, marking and
sorting to customers all over the world.
Our testers are running in Asia, Australia, North
and South America and in Europe.
The tester is a highly modular system, based
on different 19” components. This architecture
makes it possible to assemble the system according to the customers’ needs.
It is even possible to add a dynamic test component for the switching unclamped inductive load
test (avalanche test) to the parametric tester.
For very special requirements, we develop customer specific systems, e.g.
• FET commutation testers (‘real life stress
test’)
• thermal cycling testers
• …
Thermal impedance
… is a very important parameter for R&D and end
of line test. Here, too, the digital signal processing capabilities provide very accurate and repeatable results. A special fast temperature measuring module completes the setup for thermal tests
(as off the shelf instruments are too slow.)
They combine well proven hardware modules
with highly sophisticated digital signal processing
for superior accuracy and reproducibility, even in
rough industrial environment (leakage currents in
the nA range). Optimal FIR filters can be selected for each single test impulse to get best results
with minimum test time, thus reducing overall cycle time.
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Thermal transient impulse response
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200,0E-3
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150,0E-3
delta Vf [V]
MRS electronic
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Standard Parameters
MRS electronic
The testers have originally been developed to test
all relevant parameters of power semiconductors.
The above screenshot is the tester’s inbuilt oscilloscope function displaying voltage and current
of an IDSS, IGSSf, IGSSr and VGS,th measurement (raw
values as seen by the tester).
High Power
Testing automotive rectifiers however forced us to
combine the standard tests
with extended power capabilities. Therefore our tester
can also measure the thermal impedance (ZTH/RTH)
or can be used in R&D for
thermal stress/fatigue tests.
This is especially interesting
in combination with cyclic parameter (re-) tests – in one
machine, without the need to
take the parts to a 2nd parametric tester.
MRS electronic GmbH
Klaus-Gutsch-Strasse 7
78628 Rottweil / Germany
Tel.: +49 741 2807-0
Fax: +49 741 2807-44
[email protected]
www.power-semiconductor-tester.com
Testers for
Power Semiconductors