Journal of The Electrochemical Society, 150 共7兲 C457-C460 共2003兲 C457 0013-4651/2003/150共7兲/C457/4/$7.00 © The Electrochemical Society, Inc. Single-Bath Electrodeposition of a Combinatorial Library of Binary Cu1Àx Snx Alloys S. D. Beattie and J. R. Dahn Department of Physics, Dalhousie University, Halifax, Nova Scotia, Canada B3H 3J5 Electrodeposition from a single bath in a single run was used to create a combinatorial library of binary Cu-Sn alloys. Electron microprobe and X-ray diffraction studies were used to determine the average stoichiometry and the phases present as a function of position on the substrate foil. The deposited film follows the Cu-Sn phase diagram, except that Cu41Sn11 was observed instead of Cu3 Sn. Electrodes with various average stoichiometry were punched from the film and tested as negative electrodes for Li-ion cells. Electrodes taken from the high Sn content area of the electrodeposited film display high capacity 共⬃600 mAh/g兲 but poor capacity retention with cycling. Electrodes taken from the high Cu content area of the film display reduced capacity 共⬃300 mAh/g兲 with dramatically improved capacity retention. © 2003 The Electrochemical Society. 关DOI: 10.1149/1.1576769兴 All rights reserved. Manuscript submitted August 26, 2002; revised manuscript received February 5, 2003. Available electronically May 12, 2003. Cu-Sn alloys have been proposed as possible anode materials for Li-ion cells. Kepler et al.1 showed that Cu6 Sn5 can react reversibly with lithium for a few tens of cycles. Larcher et al.2 studied the Li-Cu6 Sn5 reaction using in situ X-ray diffraction 共XRD兲. Tamura et al.3 showed that Cu-Sn alloys could be prepared by electrodepositing pure tin on copper foil, followed by an annealing step. Beattie et al.4 showed that Cu6 Sn5 could be directly prepared by electrodeposition from a single bath containing both dissolved Cu2⫹ and Sn2⫹ ions. These films were shown to have approximately the same electrochemical behavior in lithium cells as the powdered samples described by Larcher et al. Electrodeposited films have the advantage that they could be directly used as electrodes in lithium-ion batteries without further processing. There are a number of binary intermetallic Cu-Sn phases,5 and the electrochemical properties of each should be considered. However, some of these phases, like Cu41Sn11 and Cu3 Sn contain little tin so one would expect them to react with little lithium, and hence be relatively ‘‘inactive’’ phases. On the other hand, Mao et al.6 have shown that it can be advantageous to mix relatively inactive phases like SnFe3 C with active phases like Sn2 Fe in efforts to obtain materials with good capacity retention and acceptable specific capacity. Therefore, we decided to prepare mixed intermetallic phases in the Cu-Sn system. We decided to prepare Cu-Sn alloys with varying composition by electroplating. Based on our previous work4 we believed that a wide range of Cu-Sn alloy compositions could be electrodeposited from a single bath using pulsed deposition in a Hull cell. Alloys prepared using a Hull cell and its variations 共i.e., rotating cylindrical Hull, RCH cell兲 have been discussed in the literature.7-10 Our method is similar to ones used in.11,12 However, our method is unique because a low frequency on/off pulsed waveform and the geometry of the Hull cell are used to exploit the exchange of deposited Sn by aqueous Cu to achieve a composition and structural spread as a function of position on the substrate. To our knowledge such a novel preparation scheme is a new method in combinatorial13 or composition-spread14,15 materials synthesis. Figure 1 shows electron microprobe results for a Cu-Sn composition-spread film prepared via electrodeposition in a single run. Starting from the bottom, Sn-rich end of the film, the position in centimeters is plotted vs. the Cu:Sn atomic ratio. The Cu:Sn atomic ratio increases along the length of the film. This shows that a combinatorial library of Cu-Sn alloys has been prepared via electrodeposition. Below, we will describe the preparation method and the behavior of a number of compositions as electrodes for Li-ion cells. Experimental Cu-Sn alloys were deposited from a pyrophosphate solution: 36 g/L Sn2P2 O7 , 135 g/L2 K2 P2 O7 , 1 g/L Cu2P2 O7 •3H2 O. Without the addition of additives a pyrophosphate bath has poor throwing power.16 A solution with good throwing power deposits a constant thickness film regardless of macroscopic cathode irregularities. A solution with poor throwing power is needed to obtain varying thickness along the cathode in the Hull cell. The bath was operated at room temperature without agitation. Deposition was performed in a Hull cell17 共not ‘‘normal’’ specifications兲 made from polyvinyl chloride 共PVC兲. The cell is 7.5 cm wide. The cathode is inclined at a 51.5° angle with respect to the anode, which is 7.5 cm wide. The closest approach of anode to cathode is 1.0 cm, and the furthest separating distance is 9.0 cm. The cathode is 11.0 cm in length and the cell is 6.9 cm tall. The cell has a volume of approximately 250 mL. A dimensionally stable titanium anode was used. All films described here were deposited on Ni foil. To ensure minimal contamination of the bath and a clean deposition surface, the Ni foil was pretreated. The foil was wiped with acetone, ethanol, and then methanol. 3M plater’s tape was used to secure the foil to the PVC backing around the immersed edges to prevent deposition on the back of the foil. Note that the platers tape slightly decreases the available area for deposition. The usable area is decreased from 11.0 ⫻ 7.5 cm to approximately 10.5 ⫻ 7.0 cm. The PVC vessel and anode were also wiped down prior to deposition. Pulsed deposition was performed using a Keithley 236 source measure unit. A Visual Basic program was written to apply pulsed waveforms using the Keithley. All deposits were performed galvanostatically. Scanning electron microscopy 共SEM兲 and energy dispersive spectroscopy 共EDS兲 studies were performed using a JEOL JXA8200 superprobe with a Noran energy dispersive spectrometer. XRD measurements were performed using an INEL CPS120 curved position sensitive detector coupled to an X-ray generator equipped with a Cu target X-ray tube. There is a monochromator in the incident beam path that limits the wavelengths striking the sample to Cu K␣ . The incident angle of the beam with respect to the sample is about 6°. The detector measures the entire diffraction pattern between scattering angles of 6° and 120° at once. The film sample is placed on an x-y translating stage that allows measurement and move operations to be sequentially programmed. Scans were taken incrementally along the length of the film. To encourage homogeneity of coexisting phases the film was annealed under argon at 200°C for 2 h prior to XRD analysis. The film was not annealed before EDS analysis. Cu-Sn film samples were tested in Li/Cu-Sn cells for their specific capacity and capacity retention. Standard 2325 共23 mm diam, 2.5 mm thick兲 coin cell hardware was used. The cells use a polypropylene microporous separator, 1 M LiPF6 dissolved in ethylene carbonate:diethyl carbonate 共EC:DEC, 33:67 vol, Mitsubishi Chemical兲 electrolyte and lithium metal as the negative electrode. All cells were assembled in an argon-filled glove box and tested using constant charge and discharge currents of 30 mA/g. C458 Journal of The Electrochemical Society, 150 共7兲 C457-C460 共2003兲 Figure 1. Cu:Sn atomic ratio and atomic % Sn as determined by electron microprobe analysis versus position on the electrodeposited film. The various symbols correspond to six separate scan lines measured along the film. An image of the deposited film is shown on the right. Electroplating Strategy In order to prepare the composition-spread library of Cu-Sn alloys, several requirements must be satisfied. First, copper deposits at more positive potentials than tin, so the tin concentration in solution should be much larger than that of copper. Second, the bath should have a poor throwing power 共like the pyrophosphate bath we picked兲 so that the current density varies with the anode and/or cathode distance in the Hull cell. This ensures that the thickness of the deposit varies with position on the substrate foil. Finally, pulsed deposition is used to create the composition spread. A series of on/off pulses are used, because primarily Sn is deposited during the on pulse, and copper from the plating solution ion exchanges with the plated tin during the off pulse according to the reaction Cu⫹2 (aq) ⫹ Sn共s) → Cu共s) ⫹ Sn⫹2 (aq). Then, a deposit like that shown schematically in Fig. 2 is created. Figure 2a shows the layers of tin rich material deposited during the on pulses, whose thickness varies along the length of the substrate electrode, and the layers of ion-exchanged copper deposited during the off pulses, whose thickness is constant along the length of the substrate electrode. In our depositions, the on pulse/off pulse sequence is repeated hundreds of times to deposit a film several micrometers thick. During the on pulse, the layer thickness deposited is estimated to range between 4.7 and 1.3 nm along the length of the substrate. Examinations of the film using small angle X-ray scattering showed that a composition modulated superlattice structure was not formed. Presumably, this is because the copper-rich and tin-rich layers are eliminated by interdiffusion. Therefore, Fig. 2b shows a schematic of the deposited film after the Cu-Sn interdiffusion occurs. Figure 1 shows that the procedure described above deposits a film where the average stoichiometry varies along the length of the substrate. Each EDS data point in Fig. 1 represents a Figure 2. 共a兲 A schematic of film structure expected using on/off pulsed deposition in a Hull cell with a Sn pyrophosphate solution containing a small amount of Cu pyrophosphate in the absence of solid-state interdiffusion. 共b兲 A schematic of the actual film stoichiometry due to interdiffusion. Figure 3. An SEM image of the deposited film. The size of the 40 m electron probe beam is indicated by the squares. Different numbers of large crystallites are sampled from place to place along the film, causing scatter in the electron microprobe data of Fig. 1. 40 ⫻ 40 m area. In that area many crystallites were sampled simultaneously and each crystallite did not necessarily have the same composition. Figure 3 shows an electron micrograph of the surface of the film with squares indicating the approximate size of the probe beam. For the three indicated positions of the squares there were different numbers of large crystallites present. Large crystallites are rich in Sn, so if the beam is analyzing an area with a large number of crystallites, a large Sn concentration will be detected. Instead, if the beam is sampling an area with very few crystallites the Sn concentration will be low. Between adjacent points the number of crystallites being analyzed can vary. This variation can result in a significant difference in the Cu:Sn atomic ratio between adjacent points, causing scatter in the data, as seen in Fig. 1. Nevertheless, it is clear that the average stoichiometry inferred from Fig. 1 varies in a roughly linear manner. Results and Discussion Figure 1 shows that a film where the Cu:Sn atomic ratio varies along the length of the film has been deposited. Using the electron microprobe results the atomic percent Sn can be determined along the length of the film 共Fig. 1, right ordinate兲. Then, the position of the film in phase space can then be mapped onto the Cu-Sn phase diagram as has been done in Fig. 4. The arrow in Fig. 4 shows the range of compositions sampled by the deposited film. In theory, using our deposition procedure, any stoichiometric range of phase space could be easily sampled given the proper electrodeposition parameters. Due to lack of control over temperature a structural range would be more difficult to sample. Electrodeposition was performed at room temperature, however the tabulated phase diagram only extends as low as 100°C. We assume that the phase diagram at 21°C is identical to that at 100°C. All samples in this paper were either prepared and studied at room temperature or were annealed to 200°C under argon. Between 20 and 200°C, the arrow in Fig. 4 passes through five distinct stoichiometric regions: Sn ⫹ Cu6 Sn5 , Cu6 Sn5 , Cu6 Sn5 ⫹ Cu3 Sn, Cu3 Sn, and Cu3 Sn, ⫹Cu. Three positions in the phase diagram 共Fig. 4兲 were chosen for focused study. A high Cu content 共4a兲, a high Sn content 共4c兲, and an intermediate area 共4b兲. According to the phase diagram, sample 4a should correspond to coexisting phases of Cu3 Sn, ⫹Cu, sample 4b should correspond to coexisting phases of Cu6 Sn5 ⫹ Cu3 Sn and sample 4c should correspond to coexisting phases of Sn ⫹ Cu6 Sn5 . The film was annealed under argon at 200°C for 2 h, Journal of The Electrochemical Society, 150 共7兲 C457-C460 共2003兲 C459 Figure 4. The Cu:Sn phase diagram. The arrow indicates the region of phase space sampled by the film 共Fig. 1兲 deposited in the Hull cell using on/off pulsed deposition. Three average compositions labeled 4a, 4b, and 4c are considered for focused analysis. Figure 6. 20 XRD patterns measured at equal spacings along the length of the film. The Cu content increases from bottom to top. Sn rich phases are observed at the bottom of the film, while Cu rich phases are observed at the top. Bragg peaks from known phases are indicated. Figure 5. XRD patterns of portions of the film corresponding to the positions 共a兲 4a, 共b兲 4b, and 共c兲 4c. Known Sn and Cu-Sn alloy XRD patterns are superimposed on the data for comparison. then XRD patterns were taken along the entire length. XRD patterns taken from the positions labeled 4a-c in Fig. 4 are presented in Fig. 5, correspondingly labeled 4a-c. XRD patterns taken from pure Sn and known Cu-Sn alloys are superimposed onto those XRD patterns. In Fig. 4a, coexisting Cu3 Sn, ⫹Cu phases are expected from the phase diagram but they are not observed. Instead, the Cu41Sn11 phase, which does not extend down to room temperature in Fig. 4, is present. Apparently Cu41Sn11 is favored by the pulsed deposition process described above, rather than Cu or Cu3 Sn. The peak near 42° in Fig. 4a is thought to arise from a copper phase containing a small amount of dissolved tin. In Fig. 4b, the Cu41Sn11 phase is present once again, where Cu3 Sn was expected. The fact that films fabricated by electrodeposition do not exactly follow the equilibrium conditions present in a phase diagram at a specified temperature is not surprising since electrodeposition does not occur at equilibrium conditions. The Cu41Sn11 phase is in the right stoichiometric range in the Cu-Sn phase diagram to appear in samples 4a and 4b, but is not expected at lower temperatures. The Cu3 Sn phase is not expected at high Cu content, Cu41Sn11 is, therefore the XRD pattern at position 4b in Fig. 4 should show coexisting Cu41Sn11 and Cu6 Sn5 phases, as it does in Fig. 5b. Furthermore, at position 4c in Fig. 4, coexisting Cu6 Sn5 and Sn is expected, as verified by the diffraction pattern in Fig. 5c. Electron microprobe results and XRD results agree with the Cu-Sn phase diagram as long as the Cu41Sn11 phase is expected at high Cu content. Figure 6 shows XRD patterns along the length of the film starting from the bottom of the film 共that is, the part of the film closest to the anode during deposition兲 up to the top of the film 共furthest from the anode during deposition and therefore Cu rich兲. The patterns that were the subject of the focused study in Fig. 5 共labeled 4a, b and c兲 are indicated in Fig. 6. The XRD patterns at the bottom of the film are rich in Sn. As the patterns progress up the film toward the Curich end of the film, the XRD pattern from Sn steadily decreases and disappears approximately a third of the way up. Approximately twothirds up the film the Cu6 Sn5 phase also disappears. Correspondingly, XRD patterns of Cu-rich alloys begin to emerge. There is a smooth transition between Sn rich and Cu rich alloys. Li/Cu-Sn coin cells were then constructed from circular electrodes punched from various places on the film. Figure 7 shows C460 Journal of The Electrochemical Society, 150 共7兲 C457-C460 共2003兲 metallic phases like Cu6 Sn5 exhibit lower capacities than Sn-rich materials, but have dramatically improved capacity retention.1,2,4 Figure 7c-h progressively illustrate the effect of increasing Cu content. Figure 7 shows that high Sn content films have higher capacity and poor capacity retention and that high Cu content films have lower capacity and dramatically improved capacity retention. Conclusions Using electrodeposition, a combinatorial library of binary Cu1⫺x Snx alloys has been successfully deposited from a single bath in a single run. The Cu:Sn atomic ratio varies almost linearly along the length of the film. Electron microprobe and XRD data agree with the Cu-Sn phase diagram except that the high temperature Cu41Sn11 phase was observed in place of Cu3 Sn. Electrochemical studies of Li/Cu-Sn cells show that Sn-rich regions of the film exhibit high capacity 共⬃600 mAh/g兲 but poor capacity retention. Cu-rich compounds exhibit lower capacity 共⬃300 mAh/g兲 with dramatically improved capacity retention. Acknowledgments The authors acknowledge 3M, 3M Canada and NSERC for financial support of this work. Dalhousie University assisted in meeting the publication costs of this article. References Figure 7. Voltage vs. capacity and capacity vs. cycle number for five Li/ Cu-Sn cells with electrodes taken along the length of the film. The Cu content increases from bottom to top. The specific capacity decreases with increasing Cu content with a corresponding increase in capacity retention. Solid dots correspond to discharge capacity while empty dots correspond to recharge capacity. specific capacity vs. cycle number and voltage vs. capacity for five electrodes taken along the length of the film. Figure 7a and b correspond to an electrode taken from the Sn-rich end of the film. Figure 7i and j correspond to an electrode taken from the Cu-rich end of the film. The trends in Fig. 7 are obvious and expected. It is well known that Sn rich compounds exhibit large capacity but poor capacity retention.18 It has also been shown that pure Cu-Sn inter- 1. K. D. Kepler, J. T. Vaughey, and M. M. Thackeray, J. Power Sources, 81-82, 383 共1999兲. 2. D. Larcher, L. Y. Beaulieu, D. D. MacNeil, and J. R. Dahn, J. Electrochem. Soc., 147, 1658 共2000兲. 3. N. Tamura, R. Ohshita, M. Fujimoto, S. Fujitani, M. Kamino, and I. Yonezu, J. Power Sources, 107, 48 共2002兲. 4. S. D. 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