Material Chemistry Contents No rb e r t Hamp p Optical Microscopy Historical development Lens aberrations Transmission / Reflection Microscopy Dark-field Microscopy Differential Interference Contrast Microscopy 4B-Microscopy Fluorescence Microscopy Confocal Microscopy Nearfield Scanning Optical Microscopy Electron Microscopy Atomic Force Microscopy Invention of Optical Microscopes No rb e r t Hamp p Earliest version - Single lens microscope Antonie van Leuuwenhoeck, 1660 magnification 275-fold, 1.3 :m Improvement of Optical Microscopes No rb e r t Hamp p Compound Microscope - two lens design Improved Design, John Yarwell, 1680 Begin of todays optical microscopy No rb e r t Hamp p Ernst Abbe Ernst Abbe together with Carl Zeiss published a paper in 1877 defining the physical laws that determined resolving distance of an objective. Known as Abbe’s Law “minimum resolving distance (d) is related to the wavelength of light (8) divided by the Numeric Aperture, which is proportional to the angle of the light cone (2) formed by a point on the object, to the objective”. Abbe Diffraction limit Begin of todays optical microscopy No rb e r t Hamp p Carl Zeiss Abbe and Zeiss developed oil immersion systems by making oils that matched the refractive index of glass. Thus they were able to make the Numeric Aperture (N.A.) to the maximum of 1.4 allowing light microscopes to resolve two points distanced only 0.2 microns apart (the theoretical maximum resolution of visible light microscopes). Leitz was also making microscope at this time. Carl Zeiss 1816-1888 Immersion Objectives Begin of todays optical microscopy No rb e r t Hamp p Otto Schott Dr Otto Schott formulated glass lenses that color-corrected objectives and produced the first “apochromatic” objectives in 1886. Chromatic Aberation-free Objectives Optical Imaging No rb e r t Hamp p Refraction of light / Snellius law Index of Refraction depends on material ! different speeed of light Application: Curved surfaces " $ F $ " f Optical Lenses No rb e r t Hamp p Properties f p f 2 f q Optical Lenses No rb e r t Hamp p Limitations - Abberations Optical Lenses No rb e r t Hamp p Aberrations F1 F2 Chromatic aberration F1 Corrected lens Spherical aberration Optical Lenses No rb e r t Hamp p Astigmatism Optical Lense Aberrations No rb e r t Hamp p Summary Monochromatic Aberrations (dependent on form of lens) Spherical aberration Coma Astigmatism Flatness of field Distortion Chromatic Aberrations (dependent on wavelength of light) Longitudinal aberration Lateral aberration Light path in optical microscope No rb e r t Hamp p Optical Microscope No rb e r t Hamp p Basic setup Optical Microscopes No rb e r t Hamp p Transmission Reflection Setup Optical Microscopes No rb e r t Hamp p Upright and Inverted Setup Optical Microscopes Reparation of real images of light source and object No rb e r t Hamp p No rb e r t Hamp p Limit for smallest resolvable distance d between 2 points is (Rayleigh criterion): A 2 Light cone NA=n(sin2) Thus high NUMERICAL APERTURE is critical for high magnification (n=refractive index) Optical Microscopy No rb e r t Hamp p Numerical Aperture Typical Objectives Cheap: Expensive: Oil Immersion: NA 0,1 Resolution 2,75 :m NA 0,65 Resolution 0,42 :m NA 1,4 Resolution 0,20 :m = 200 nm Optical Microscopy No rb e r t Hamp p Magnification vs. Resolution Objectives No rb e r t Hamp p Numerical aperture, resolution and working distance < The wider the receiving angle of the lens the greater its resolving power. < The higher the NA the shorter the working distance. Objectives No rb e r t Hamp p Immersion and cover glass thickness Objectives No rb e r t Hamp p Nomenclature F - Infinity corrected PLAN-APO-40X1.30 N.A. 160/0.22 Flat field Apochromat Magnification Numerical Tube Coverglass Aperture Length Thickness Factor Optical Industry in Germany No rb e r t Hamp p ... quite a time ago Tubusl. 160 mm 4.0 mm Apert 0.95 C. Zeiss Jena No. 21 Apochromat Zeiss von 1886 vernickeltes und zaponiertes Messing, gebläuter Stahl, in signierter Messingdose. Mehrzeilig signiertes und nummeriertes Objektiv mit Korrektur Illumination of Objects No rb e r t Hamp p Bright field Dark field Full aperture illuminated Central part of light cone is blocked Illumination of Object No rb e r t Hamp p Dark-Field A central obstruction blocks the central cone. The sample is only illuminated by the marginal rays. These marginal rays must be at angles too large for the objective lens to collect. Only light scattered by the object is collected by the lens. (Tyndall effect) No staining of objects required. Imaging Techniques No rb e r t Hamp p Dark field illumination Not absorption but refractive index changes are imaged. This causes that mostly the outer structure is well received, however, inner structures are often invisible. Imaging Techniques No rb e r t Hamp p Phase Contrast Microscopy Principle 1) Blocking using a ring aperature before illumination of the object 2) Phase rotation by 8/2 plate of the object light 3) Overlapping of objecte light and illuminating light Transmission Phase Contrast Phasenkontrast-Mikroskopie No rb e r t Hamp p Phasenshift näherungsweise proportional der Dichte No rb e r t Hamp p Phasen-Kontrast beim Röntgen No rb e r t Hamp p Rattenherz Phase Contrast Microscopy No rb e r t Hamp p Principle 2 apertures in close proximity first diffraction orders are far from zeroth order ! strong disturbance on main image (visible) 2 apertures more separated first diffraction orders are close to zeroth order ! weaker disturbance off main image (lower visibility) Differential Interference Contrast (DIC) No rb e r t Hamp p Taking advantage of polarized light and optical birefringence DIC No rb e r t Hamp p Imaging Techniques No rb e r t Hamp p Differential Interference Contrast (DIC) Microscopy Imaging techniques No rb e r t Hamp p Differential Interference Microscopy Electron Microscopy No rb e r t Hamp p DIC No rb e r t Hamp p Flourescence Microscopy No rb e r t Hamp p Principle Fluorescence Microscopy No rb e r t Hamp p Not Diffraction limited Fluorophores No rb e r t Hamp p Chemical Structures Confocal Microscopy No rb e r t Hamp p Principle setup Principle 1) Point like illumination of the object by means of a first aperture. Focusing in three dimensions 2) Detection of object beams from focal points different in lateral AND vertical position at second aperture. All other layers contribute less than proportional 3) Imaging by 3D-Scanning Confocal Microscopy No rb e r t Hamp p Scanning System Confocal Microscopy No rb e r t Hamp p Examples Paramecium labeled with an anti-tubulin-antibody showing thousands of cilia and internal microtubular structures. Whole mount of Zebra Fish larva stained with Acridine Orange, Evans Blue and Eosin. Comparison of Fluorescence and Confocal Microscopy No rb e r t Hamp p One layer out of an image stack Mitotic Cell Imaging conditions No rb e r t Hamp p Wide field, confocal, multiphoton 4B-Mikroskopie No rb e r t Hamp p Fluoreszenzspektroskopie mit optimaler Auflösung No rb e r t Hamp p Confocal vs. 4B No rb e r t Hamp p Golgi Apparat Confocal Microscopy No rb e r t Hamp p Resolution The Nyquist Theorem Nyquist theory describes the sampling frequency (f) required to represent the true identity of the sample, i.e., how many times must you sample an image to know that your sample truly represents the image? In other words to capture the periodic components of frequency f in a signal we need to sample at least 2f times Nyquist claimed that the rate was 2f. It has been determined that in reality the rate is 2.3f - in essence you must sample at least 2 times the highest frequency. For example in audio, to capture the 22 kHz in the digitized signal, we need to sample at least 44.1 kHz (unless of course you can’t hear 22kHz and then you don’t need 44.1 kHz!!!!) Doing ‘fast’ images is nonsense ! Microscopes and their resolution No rb e r t Hamp p Normal Optical Microscope Resolution 200 nm Phase Contrast Microscopy Enhanced Contrast DIC-Microscopy Enhanced Contrast, Height measurement Confocal Microscopy 3D-Images, Resolution 150 nm 4Pi-Microscopy Resolution 70 nm NSOM Resolution 20 nm AFM Resolution 10 nm, Force Measurement Fluorescence-Technique Resolution like carrier Microscope extreme contrast, single atoms/molecules emitting NSMM Resolution 200 nm Measurement of dielectric constant
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